Malaga, Spain — AT4 wireless has announced the T4010 LTE RF test system, a complete and cost effective test platform to perform RF parameter verification throughout the development life of LTE enabled UEs, from the early stages of silicon integration to final device validation and certification.
Target test applications include R&D at chipset manufacturers and UE developers, as well as certification laboratories. The test system provides engineers full verification and validation capabilities for the RF transceiver of the LTE UE, allowing not only customization of 3GPP defined RF test cases, but also complete test case development and full control of the test system.
The T4010 is based on the E2010 broadband wireless test set, a powerful and expandable hardware platform that minimizes the operating costs and the amount of instruments needed in the system. The E2010 is the cornerstone of all AT4 wireless LTE testing products and the basic configuration of the AT4 wireless T4010 is based on an E2010 broadband wireless test set plus additional testing software. This configuration provides MIMO 2x2, embedded measurement capabilities, integrated interferer generation and channel emulation. For tests requiring an extended frequency range, the E2010 can be connected to a wide array of commercially available instruments allowing the reuse of already purchased equipment, thus minimizing the involved acquisition costs.
Further, existing MiNT T1140, T1150/52 and T2110 RF test systems from the company for 2G, 3G and WiMAX, can be seamlessly upgraded to support LTE with minimal system downtime while retaining all the functionality already present in the MiNT system.
The T4010 is designed to minimize testing time, obtaining several measurement results from a single capture. It also provides a high level of automation, managing test campaigns of several UEs in sequence. Applications supported by the LTE RF test system cover all aspects of RF testing: functional block verification, RF parametric testing, margin search, RF performance testing and complete system validation and certification, including type approval.
Juan P Hidalgo, LTE Product Manager at AT4 wireless comments, "The T4010 LTE RF Test System one box solution provides the complete set of RF testing capabilities currently requiring expensive multi-instrument systems, in a convenient and cost effective single instrument platform."
AT4 wireless has also announced LTE test systems for Physical Layer and Protocol Stack requirements.
For further information visit www.at4wireless.com.
