National Instruments: Testing RF Front-End ICs With STS

March 06, 2017 // By National Instruments
The Semiconductor Test System (STS) series features production-ready test systems that combine the NI PXI platform, TestStand test management software, and LabVIEW graphical programming inside a fully enclosed test head. Its “tester-in-a-head” design houses all the key components of a production tester including system controllers; DC, AC, and RF instrumentation; device under test (DUT) interfacing; and device handler/prober docking mechanics. This white paper discusses how a platform-based approach can bridge the gap from characterization to production.
National Instruments, test, semiconductor,

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