Automation the key to testing very high volumes of advanced smartphones: Page 3 of 6

February 10, 2014 // By Jean-Pierre Joosting
As wireless technology continues to evolve, the rise of the smartphone continues to gather pace along with the challenges of cost-effectively producing many millions of these devices. One critical component in the manufacturing chain is ensuring that test times for smartphones remain reasonable.
the key factors driving the trend towards automated testing.

Automated testing removes human error and enables better reporting. It also removes subjectivity, for example, compare a human operator verifying the quality of a smartphone camera versus an automated, standardised process.
Higher volumes, increasing complexity and rising labour costs, along with the ability to reduce error and eliminate subjectivity make a compelling business case for automated test.

G3 — final functional testing

Providing final functional testing of smart phones, the JOT G3 enables fully automatic tests on handsets in a repeatable and reliable environment, which helps to maximise capacity and quality with low labour costs.

The G3 has a smaller footprint and offers an all-in-one feature enabling all DUT interface testing including RF, screen, touch screen, buttons, audio, and plug-in connections. Another key feature is the ability to combine different tests on the same platform.

It has an easy and fast product change over, together with a simple and in-expensive product specific adaptor. With a self-diagnostic which verifies machine functionality to speed up problem solving and additional features and instruments available to add to the product, the JOT G3 offers the best choice for lean environment.
M10 functional test system.

The JOT M10 functional test system has been developed to address the need to speed up the development cycles and to overcome the capacity challenges in manufacturing of smart devices such as smart phones and tablet PCs or basically any electronics product with high production quality requirements.

The JOT M10 is a scalable and modular system for board and PCB-level functional testing, flashing and RF-tuning of smart devices. One of its key benefits is that the very same test solution can be taken from R&D to production to secure efficient and swift production ramp up. The other key benefit is the modular system architecture, which enables the M10 to easily adapt to production volume variations during a product’s life cycle, and

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