Compact, portable test instruments offer network and spectrum analysis

October 02, 2017 //By Jean-Pierre Joosting
At European Microwave Week 2017 in Nuremberg, Rohde & Schwarz is introducing a new family of compact, portable and versatile instruments for research, service and production comprising the ZNL network analyzer and FPL1000 spectrum analyzer.

Versatile measurement capabilities make the instruments a safe investment, starting with a pure spectrum analyzer (FPL1000) or a standalone network analyzer, which can be turned into a 3-in-1 allrounder by adding the integrated spectrum analysis option and power sensors (ZNL).

The ZNL network analyzer and the FPL1000 spectrum analyzer cover the most important RF measurements. These include the characterization of components such as antennas, attenuators, filters and amplifiers, as well as measurements on signal sources including spectral measurements, analog and digital signal demodulation and accurate power measurements.

Instruments from this latest family have a footprint of just 408- x 235-mm. This saves up to 60 percent of space on the workbench compared with conventional approaches. The instruments feature a large 10.1-inch WXGA touchscreen, providing a good overview of measurement details. The touchscreen allows users to readily set the center frequency and reference level and zoom the span or amplitude measurement range. Weighing just 6- - to 8-kg and featuring a carrying handle and optional battery, the instruments are fully portable and can be used wherever needed.

With frequency ranges from 5 kHz to 3 GHz or 6 GHz, the ZNL is well suited for various RF component measurement applications in industrial electronics and wireless communications. The network analyzer offers solid  performance with a dynamic range of up to 130 dB (typical) and an output power range from -40 dBm to +3 dBm (typical). The measurement speed is very high, for instance 16.7 ms (401 points, 100 kHz IF bandwidth, 200 MHz span, two-port calibration). Standard features include embedding/deembedding, fixture compensation, time domain measurements and support of automatic calibration units.