Accuracy and reliability
As an illustration of the accuracy and reliability of the measurement results provided by this latest generation of test instruments, the pulse pattern generator has an intrinsic jitter of typically 115 fs RMS, as well as a typical Tr/Tf of 12 ps. Other key specifications include a peak-to-peak jitter of typically 6 ps maximum, and typical input sensitivity of the internal error detector of 15 mV.
Complementing this high performance are support for integrated multi-channel testing up to 16 channels 32Gbps, and multiple features that improve accuracy and efficiency. For example, a link negotiation function supporting high-speed digital interface standards connects the test instrument to the device under test for improved bus interface evaluation. Engineers can use this function to conduct PCI Express Gen 1 to Gen 4, and future Gen 5, tests, LTSSM status analysis, jitter generation, and CM/DM noise injection. A jitter measurement function evaluates signal integrity, while a 10Tap emphasis function and equaliser function can be used to characterise test signals according to transmission path loss.
The test system can also be configured with peripheral equipment for expanded measurement capability. For example, an integrated solution combining the BERT tester with other instruments can support generation of the 32 Gbaud and 64 Gbaud PAM4 signals required for 200 GbE and 400 GbE measurements, BER measurements, jitter and amplitude noise injection, and emphasis addition, for versatile future-proof standards support.