Keysight delivers 110 GHz for terabit high speed serial and optical designs

September 19, 2018 //By Nick Flaherty
Keysight delivers 110 GHz for terabit high speed serial and optical designs
Keysight has developed a new data acquisition chipset in Indium Phosphide (InP) for an oscilloscope that can handle up to 110 GHz of analogue bandwidth and terabits of data per second.

The Infiniium UXR family of scopes is aimed at the latest high-speed serial such as DDR, USB and PCIe and optical designs as well as PAM4, 5G, radar and satellite communications.

“When we started this programme and looked at what the customer needs would be in the future we made a conscious decision to develop an entirely new technology set rather than adapt existing technology, that always has tradeoffs,” said Dave Cipriani, Vice President for the Digital and Photonics Centre of Excellence at Keysight.

 “It’s a completely new chipset on the next generation of the process, HB2D. This fourth generation 300 GHz InP enables direct capture of the 110 GHz without interleaving and we developed several chips in the front end module: a signal conditioning amplifier, the pre-amp in the HB2D InP process that goes into a 256 GSa/s sampler and then into a SiGe process with lower samplers that we can get commercially.”

The 10-bit differential A/D converter operates at 64 GSa/s (GSamples/s) and is interleaved across four chips to provide the total sampling of 256 GSa/s, and in the high end 110 GHz system there is one acquisition card per channel.

“This means we are sampling 10 Tbit/s – we take 34 measurements in the time it takes light to travel 1cm,” he said. “To process all of this data we invented a new processor in 28nnm CMOS – do some of the correction in phase and magnitude and interleaving correction using proprietary filters. We’ve also added hardware acceleration in key areas so we have 100K waveform/s in the plotter, up from 3K in software. Another area is the display and measurements for real time eye measurements – 1m /s – this is a big benefit to debugging serial buses.”

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