Parametric test system supports wide bandgap (WBG) fabrication

October 06, 2020 //By Jean-Pierre Joosting
Keithley S530 Series parametric test system with KTE 7 software
Platform maximizes measurement performance and minimizes cost to help semiconductor manufacturers compete in high-growth emerging markets such as 5G and IoT

Tektronix, Inc., has released the Keithley S530 Series parametric test system with KTE 7 software and other enhancements. The S530 platform enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. This reduced overall cost of ownership profile helps manufactures meet aggressive price pressures in competitive new markets.

New semiconductor products based on emerging wide bandgap (WBG) technologies such as GaN and SiC offer the promise of faster switching speeds, wider temperature ranges, better power efficiency, and other benefits. To meet testing needs for these products, the KTE 7-based S530 parametric test system boasts lab-grade measurement performance with minimal set-up and test time. High-speed, fully flexible configurations up to 1100-V can evolve as new applications emerge and requirements change. This allows chip manufacturers to cost-effectively and efficiently expand into high-growth power and WBG devices (including the automotive market), with minimal test/set-up time, on a single system, and with minimal investment.

"Analog and mixed-signal semiconductor manufacturers continue to experience strong demand from new end-use applications in 5G communications, automotive, IoT, medical, green energy, and other markets," says Chris Bohn, vice president and general manager at Keithley/Tektronix. "This significant test platform update helps those customers bring new products to market more quickly and cost-effectively, while giving them the agility to adapt to new requirements in the future.”


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