Supported application measurements currently include:
Spectrum analyzer mode – provides further insights into the device parameters to display the output spectrum along with S-parameters using the multichannel view function.
Time domain analysis (TDR) and extended time domain analysis – for efficient time domain analysis with enhanced resolution. Enhanced TDR reveals the transmission quality at a glance with rise time, skew and eye diagrams for different bit patterns.
Intermodulation Distortion – with up to four internal high quality RF sources it is possible to determine the intermodulation characteristics of amplifiers and mixers fast and with high accuracy.
Mixer measurements and arbitrary frequency converting measurements – allows measurements of magnitude and phase on frequency converters accurately and simply using internal sources and dual LO receiver technology.
Group delay measurements on frequency converters without LO access – unique two tone technique measuring group delay and relative phase on frequency converters where there is no access to the internal LO or the reference frequency.
Pulsed measurements – convenient pulse measurements with four Internal pulse modulators for pulse generation. Analysis with short point in pulse measurements or advanced pulse profile mode.
Millimeter wave extensions – using the external family of ZCxxx frequency converters the base frequency of the ZNA can be easily extended into the terahertz range.
Most features are software based and further features will be added in the near future. Users can add options as needed by purchasing an unlock optioin. Options can also be rented for a fixed period of time.
A Noise Figure option is slated for Q2 that will combine standard measurements along with the noise figure characterisation of the DUT to gain further understanding of device behaviour with one connection. Also expected at a later date is an integrated FFT analyser option.