Semiconductor material quality measuring technique 100,000 times more sensitive : Page 3 of 3

April 11, 2019 //By Jean-Pierre Joosting
Semiconductor material quality measuring technique 100,000 times more sensitive
A team of researchers has developed a measuring technique to characterize materials at scales much smaller than any current technologies – and is expected to accelerate the discovery and investigation of 2D, micro- and nanoscale materials.

One area certain to benefit from the real-world applications of this technology is infrared detection, a vital component in molecular sensing, thermal imaging and certain defense and security systems.

"A better understanding of infrared materials could lead to innovations in night-vision goggles or infrared spectroscopy and sensing systems," Wasserman said.

High-speed detectors operating at these frequencies could even enable the development of free-space communication in the long wavelength infrared – a technology that enables wireless communication in difficult conditions, in space or between buildings in urban environments.

The research was funded by Air Force Research Laboratories and is part of an ongoing collaboration between Wasserman and his Mid-IR Photonics Group at UT, close collaborators at Eglin Air Force Base and researchers from The Ohio State University, University of Wisconsin and Sandia National Laboratories.



See also: Researchers create nanostructures of previously impossible materials for optoelectronics

See also: Non-line-of-sight for underwater optical communications

Vous êtes certain ?

Si vous désactivez les cookies, vous ne pouvez plus naviguer sur le site.

Vous allez être rediriger vers Google.