Test contactor maintains native DUT impedance, maximises RF power transfer

January 29, 2019 //By Julien Happich
Test contactor maintains native DUT impedance, maximises RF power transfer
The ICON contactor is designed specifically for maintaining the native impedance of a device–under–test (DUT) through the contactor to the test system.

Functional and AC parametric testing of high speed devices requires a high and bandwidth low noise interconnect to maintain the quality and/or fidelity of the test signal. As an impedance controlled contactor the ICON maximizes high frequency power transfer by minimizing signal reflections (Return Loss).

The ICON is simple in its design and effective in use with insertion loss greater than 52 GHz at – 1 dB without distorting the test signal. The ICON spring probes carrying test signals that are impedance matched to the DUT and the test system at 50 Ohms. The ICON’s metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminium body blocks both static and non-static external electric fields (random noise). The 50 Ohm ICON is impedance matched to the device under test is the best way to maximize high frequency power transfer by minimizing signal reflections (Return Loss).

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